Tuesday, 4th February 2025
- 9:00: Registration & welcome with coffee
- 10:30: Introduction of the Industry Day (J. Sijbers)
- 10:40-12:00: Talks by Sponsors I (Chair: Joaquim Sanctorum and Caroline Bossuyt)
- 10:40: Dragonfly: "Unleashing AI in Industrial CT: The Dragonfly Edge", (Speaker: Anton Du Plessis)
- 10:50: Comet Yxlon, "Large Volume CT Scanning: A Game-Changer in the Inspection Industry", (Speaker: Christian Jeuschede)
- 11:00: Excillum: "High-speed inline and at-line CT enabled by MetalJet sources", (Speaker: Fredrik von Hofsten)
- 11:10: Math2Market gmbH: "GeoDict software for digital testing, inspection, visualization, and evaluation of CT data", (Speaker: Aaron Widera)
- 11:20: ESRF: "ESRF: pushing the boundaries of material characterisation", (Speaker: Athanasios Papazoglou)
- 11:30: Comet X-ray , "Introducing FYNE: an optimized nano module from Comet X-ray", (Speaker: Chris Nicholson)
- 11:40: Dectris, "Nano-CT and continuous kHz 5D-micro-CT for batteries and electronics with DECTRIS large area photon-counting detectors", (Speaker: Spyridon Gkoumas)
- 11:50: Hamamatsu Photonics, "Developments of Microfocus X-ray sources for high throughput CT", (Speaker: Simon Whitbread)
- 12:00-13:00: Light lunch
- 13:00 -14:45: Talks by Sponsors II (Chair: Jonathan Sanctorum and Jian Deng)
- 13:00: EZRT, "Pioneering Non-Destructive Technologies for Safety, Sustainability, and Circular Economy in the Automotive, Agriculture, and Recycling Industries", (Speaker: Michael Salamon)
- 13:15: Bruker, "The Power of Platform", (Speaker: Diederik Ellerbroek)
- 13:30: Nikon Metrology, "Breaking the Tradeoff: Utilising Deep Learning AI with X-ray Computed Tomography for Unparalleled Clarity and Speed", (Speaker: Chris Price)
- 13:45: X-RAY WorX: "Optimization of Lifetime of Microfocus X-ray tubes", (Speaker: Jens Peter Steffen)
- 14:00: Royma Tech, "Inline Inspection of Battery Overhang with Royma Gantry CT", (Speaker: Gabor Szabo)
- 14:15: Mitos GmbH, "CT data processing using X-AID", (Speaker: Marian Willner)
- 14:30: Neoscan, "From lab to desk: redefining x-ray CT imaging", (Speaker: Evi Bongaers)
- 14:45 -15:15: Coffee Break
- 15:15 -17:00: Talks by Sponsors III (Chair: Pavel Paramonov and Caroline Bossuyt)
- 15:15: Tescan XRE, "State-of-the-art in dynamic and spectral micro-CT imaging", (Speaker: Jan Dewanckele)
- 15:30: HEITEC PTS GmbH, HeiDetect FX InlineCT – next moves for speed and size, (Speaker: Timo Frisch)
- 15:45: Thermo Fisher Scientific, Working in 4D and new deep learning features in Avizo Software, (Speaker: Kevin Chrispeels)
- 16:00: Rigaku, "Versatility of Rigaku CT systems", (Speaker: Ramil Gainov)
- 16:15: Waygate Technologies, "Innovations in industrial CT", (Speaker: Alexander Suppes)
- 16:30: Diondo, "Diondo: High energy - resolution – versatility", (Speaker: Benjamin Zengerling)
- 16:45: Spectrum Logic, "High-speed inline battery CT: The CMOS advantage", (Speaker: Asmar Khan)
- 15:15: Tescan XRE, "State-of-the-art in dynamic and spectral micro-CT imaging", (Speaker: Jan Dewanckele)
- 17:00-17:30: Coffee Break
- 17:30- 18:20: Talks by Sponsors IV (Chair: Pieter-Jan Vanthienen and Jian Deng)
- 17:30: Reactiv'IP, IPSDK Explorer, optimized & transparent Image analysis software: Machine Learning accuracy descriptors latest innovation, (Speaker: Joseph Baptista)
- 17:40: Voxray GmbH, Next Generation CT-Reconstruction, (Speaker: Darius Rueckert)
- 17:50: SANYING, AI expands the application of X-ray CT, (Speaker: Xing Ju)
- 18:00: Zeiss, Solutions for advanced X-ray analysis (Speaker: Gunnar Lumbeeck)
- 18:10 RX Solutions, Xray microCT for industry and research: challenges and solutions, (Speaker: Roland Le Floc'h)
- 19:15- 20:30:Reception Antwerp city hall (limited to 90 participants, invitation only)
Wednesday, 5th February 2025
- 08:30 - 08:40 Welcome and Introduction of the Scientific Program
- 08:40 - 09:10 Keynote I: Prof. Dr. Alessandro Olivo (UCL, UK): 'Applications of single- and double-mask phase and multi-contrast x-ray imaging to industrial NDT and beyond'
- 09:10 - 10:30 SES-01: Non-destructive Testing I
- 10:30 - 11:00 Coffee Break
- 11:00 - 12:20 SES-02: Material Characterization I
- 12:20 - 13:40 Lunch
- 13:40 - 15:20 SES-03: Deep Learning and Visualization Techniques
- 15:20 - 15:50 Coffee Break
- 15:50 - 17:10 SES-04: Instrumentation and New Methods I
- 17:10 - 17:30 ICT 2025 Group photo
- 17:30 - 19:30 P-01: Poster Session, light dinner & live music by FELT.
- 19:30 - 21:30 Guided tour to the Cathedral
Thursday, 6th February 2025
- 08:30 - 09:00 Keynote II: Dr. Lucia Mancini (ZAG), Slovenia: "Multimodal and multiscale dynamic imaging for material characterization"
- 09:00 - 10:20 SES-05: Deep Learning-based Inspection
- 10:20 - 10:50 Coffee Break
- 10:50 - 12:30 SES-06: Reconstruction, Algorithms and Optimization I
- 12:30 - 13:50 Lunch
- 13:50 - 15:10 SES-07: Reconstruction, Algorithms and Optimization II
- 15:10 - 15:40 Coffee Break
- 15:40 - 17:00 SES-08: Non-destructive Testing II
- 18:30 - 23:00 Conference diner: Grand Café Horta
Friday, 7th February 2025
- 08:30 - 09:00 Keynote III: Prof. Dr. ir. Em. Martine Wevers (KU Leuven): '4D-XCT in NDT: Advanced understanding of material behavior'
- 09:00 - 10:40 SES-09: Material Characterization II
- 10:40 - 11:10 Coffee Break
- 11:10 - 12:30 SES-10: Instrumentation and New Methods II
- 12:30 - 12:40 Closing & ICT 2026 Preview
- 12:40 - 13:00 Take-a-way light lunch
- 09:30 - 12:10 FoodPhase Parallel Session