Tuesday, 4th February 2025

  • 9:00-10:30: Registration & welcome with coffee
  • 10:30-10:40: Introduction of the Industry Day
  • 10:40-12:00: Talks by Sponsors I
    • 10:40-10:50: Dragonfly: "Unleashing AI in Industrial CT: The Dragonfly Edge", (Speaker: Anton Du Plessis)
    • 10:50-11:00: Comet Yxlon, "Large Volume CT Scanning: A Game-Changer in the Inspection Industry", (Speaker: Christian Jeuschede)
    • 11:00-11:10: Excillum: "High-speed inline and at-line CT enabled by MetalJet sources", (Speaker: Fredrik von Hofsten)
    • 11:10-11:20: Math2Market gmbH: "GeoDict software for digital testing, inspection, visualization, and evaluation of CT data", (Speaker: Aaron Widera)
    • 11:20-11:30: ESRF: "ESRF: pushing the boundaries of material characterisation", (Speaker: Athanasios Papazoglou)
    • 11:30-11:40: Comet X-ray , "Introducing FYNE: an optimized nano module from Comet X-ray", (Speaker: Chris Nicholson)
    • 11:40-11:50: Dectris, "Nano-CT and continuous kHz 5D-micro-CT for batteries and electronics with DECTRIS large area photon-counting detectors", (Speaker: Spyridon Gkoumas)
    • 11:50-12:00: Hamamatsu Photonics, "Developments of Microfocus X-ray sources for high throughput CT", (Speaker: Simon Whitbread)
  • 12:00-13:00: Light lunch
  • 13:00 -14:45: Talks by Sponsors & Partners II
    • 13:00-13:15: EZRT, TBD
    • 13:15-13:30: Bruker, TBD
    • 13:30-13:45: Nikon Metrology, "Breaking the Tradeoff: Utilising Deep Learning AI with X-ray Computed Tomography for Unparalleled Clarity and Speed", (Speaker: Chris Price)
    • 13:45-14:00: X-RAY WorX: "Optimization of Lifetime of Microfocus X-ray tubes", (Speaker: Jens Peter Steffen)
    • 14:00-14:15: Ryma Tex, "Inline Inspection of Battery Overhang with Royma Gantry CT", (Speaker: Gabor Szabo)
    • 14:15-14:30: Mitos GmbH, "CT data processing using X-AID", (Speaker: Marian Willner)
    • 14:30-14:15: Neoscan, "From lab to desk: redefining x-ray CT imaging", (Speaker: Evi Bongaers)
  • 14:45 -15:15: Coffee Break
  • 15:15 -17:00: Talks by Sponsors III
    • 15:15-15:30: Tescan XRE, "State-of-the-art in dynamic and spectral micro-CT imaging", (Speaker:  Jan Dewanckele)
    • 15:30-15:45: HEITEC PTS GmbH, HeiDetect FX InlineCT – next move for speed, (Speaker: Christian Abt)
    • 15:45-16:00: Thermo Fisher, Working in 4D and new deep learning features in Avizo Software, (Speaker: Kevin Chrispeels)
    • 16:00-16:15: Rigaku, "Versatility of Rigaku CT systems", (Speaker: Ramil Gainov)
    • 16:15-16:30: Waygate Technologies, "Innovations in industrial CT", (Speaker: Oliver Brunke)
    • 16:30-16:45: Diondo, "Diondo: High energy - resolution – versatility", (Speaker: Benjamin Zengerling)
    • 16:45-17:00: Spectrum Logic, "High-speed inline battery CT: The CMOS advantage", (Speaker: Asmar Khan)
  • 17:00-17:30: Coffee Break
  • 17:30- 18:20: Talks by Sponsors IV
    • 17:30-17:40: Reactiv'IP, IPSDK Explorer, optimized & transparent Image analysis software: Machine Learning accuracy descriptors latest innovation, (Speaker: Joseph Baptista)
    • 17:40-17:50: Voxray GmbH, Next Generation CT-Reconstruction, (Speaker: Darius Rueckert)
    • 17:50-18:00: SANYING, AI expands the application of X-ray CT, (Speaker: Xing Ju)
    • 18:00-18:15: Zeiss, TBD
    • 18:15-18:25: RX Solutions, Xray microCT for industry and research: challenges and solutions, (Speaker: Solène Valton)
  • 19:00-20:30: Reception Antwerp city hall (limited to 90 participants)

Wednesday, 5th February 2025

Thursday, 6th February 2025

Friday, 7th February 2025