Tuesday, Feb 4 (09:00-18:20)

  • 9:00: Registration & welcome with coffee
  • 10:30: Introduction of the Industry Day (J. Sijbers)
  • 10:40-12:00: Talks by Sponsors I   (Chair: Joaquim Sanctorum and Caroline Bossuyt)
    • 10:40: Dragonfly: "Unleashing AI in Industrial CT: The Dragonfly Edge", (Speaker: Anton Du Plessis)
    • 10:50: Comet Yxlon, "Large Volume CT Scanning: A Game-Changer in the Inspection Industry", (Speaker: Christian Jeuschede)
    • 11:00: Excillum: "High-speed inline and at-line CT enabled by MetalJet sources", (Speaker: Fredrik von Hofsten)
    • 11:10: Math2Market gmbH: "GeoDict software for digital testing, inspection, visualization, and evaluation of CT data", (Speaker: Aaron Widera)
    • 11:20: ESRF: "ESRF: pushing the boundaries of material characterisation", (Speaker: Athanasios Papazoglou)
    • 11:30: Comet X-ray , "Introducing FYNE: an optimized nano module from Comet X-ray", (Speaker: Chris Nicholson)
    • 11:40: Dectris, "Nano-CT and continuous kHz 5D-micro-CT for batteries and electronics with DECTRIS large area photon-counting detectors", (Speaker: Spyridon Gkoumas)
    • 11:50: Hamamatsu Photonics, "Developments of Microfocus X-ray sources for high throughput CT", (Speaker: Simon Whitbread)
  • 12:00-13:00: Light lunch
  • 13:00 -14:45: Talks by Sponsors II  (Chair: Jonathan Sanctorum and Jian Deng)
    • 13:00: EZRT, "Pioneering Non-Destructive Technologies for Safety, Sustainability, and Circular Economy in the Automotive, Agriculture, and Recycling Industries", (Speaker: Michael Salamon)
    • 13:15: Bruker, "The Power of Platform", (Speaker: Diederik Ellerbroek)
    • 13:30: Nikon Metrology, "Breaking the Tradeoff: Utilising Deep Learning AI with X-ray Computed Tomography for Unparalleled Clarity and Speed", (Speaker: Chris Price)
    • 13:45: X-RAY WorX: "Optimization of Lifetime of Microfocus X-ray tubes", (Speaker: Jens Peter Steffen)
    • 14:00: Royma Tech, "Inline Inspection of Battery Overhang with Royma Gantry CT", (Speaker: Gabor Szabo)
    • 14:15: Mitos GmbH, "CT data processing using X-AID", (Speaker: Marian Willner)
    • 14:30: Neoscan, "From lab to desk: redefining x-ray CT imaging", (Speaker: Evi Bongaers)
  • 14:45 -15:15: Coffee Break
  • 15:15 -17:00: Talks by Sponsors III  (Chair: Pavel Paramonov and Caroline Bossuyt)
    • 15:15: Tescan XRE, "State-of-the-art in dynamic and spectral micro-CT imaging", (Speaker:  Jan Dewanckele)
    • 15:30: HEITEC PTS GmbH, HeiDetect FX InlineCT – next moves for speed and size, (Speaker: Timo Frisch)
    • 15:45: Thermo Fisher Scientific, Working in 4D and new deep learning features in Avizo Software, (Speaker: Kevin Chrispeels)
    • 16:00: Rigaku, "Versatility of Rigaku CT systems", (Speaker: Ramil Gainov)
    • 16:15: Waygate Technologies, "Innovations in industrial CT", (Speaker: Alexander Suppes)
    • 16:30: Diondo, "Diondo: High energy - resolution – versatility", (Speaker: Benjamin Zengerling)
    • 16:45: Spectrum Logic, "High-speed inline battery CT: The CMOS advantage", (Speaker: Asmar Khan)
  • 17:00-17:30: Coffee Break
  • 17:30- 18:20: Talks by Sponsors IV  (Chair: Pieter-Jan Vanthienen and Jian Deng)
    • 17:30: Reactiv'IP, IPSDK Explorer, optimized & transparent Image analysis software: Machine Learning accuracy descriptors latest innovation, (Speaker: Joseph Baptista)
    • 17:40: Voxray GmbH, Next Generation CT-Reconstruction, (Speaker: Darius Rueckert)
    • 17:50: SANYING, AI expands the application of X-ray CT, (Speaker: Xing Ju)
    • 18:00: Zeiss, Solutions for advanced X-ray analysis (Speaker: Gunnar Lumbeeck)
    • 18:10  RX Solutions, Xray microCT for industry and research: challenges and solutions, (Speaker: Roland Le Floc'h)
  • 19:15- 20:30: Reception at the Antwerp city hall (limited to 90 participants, invitation only)