SES-04: Instrumentation and New Methods I
- Exploring image quality improvements in high-speed dual threshold photon-counting micro-CT
Till Dreier1, Spyridon Gkoumas2
1Excillum AB, Sweden; 2DECTRIS Ltd., Switzerland
- High-Energy Microtomography using Synchrotron Radiation at PETRA III / DESY
Felix Beckmann, Julian Moosmann, Joerg U. Hammel, Fabian Wilde
Helmholtz-Zentrum Hereon, Germany
- Gulliver – A new kind of industrial CT
Michael Salamon1, Nils Reims1, Dimitri Prjamkov1, Dennis Ak2, Markus Kronenberger3, Katja Schladitz3, CLaudi Redenbach4, Szymon Grzesiak4, Christoph De Sousa4, Catherina Thiele4, Matthias Pahn4
1Fraunhofer-Institut für Integrierte Schaltungen (IIS), Germany; 2OHB Digital Connect GmbH, Germany; 3Fraunhofer-Institut für Techno- und Wirtschaftsmathematik (ITWM), Germany; 4Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau (RPTU), Germany
- Correcting for focal spot drift in edge illumination X-ray phase contrast imaging
Nicholas Francken, Jonathan Sanctorum, Ben Huyge, Jan Sijbers, Jan De Beenhouwer
University of Antwerp, Belgium