S-04: Instrumentation and New Methods I

15:50

​Exploring image quality improvements in high-speed dual threshold photon-counting micro-CT

Till Dreier¹, Spyridon Gkoumas²​

​¹Excillum AB, Sweden; ²DECTRIS Ltd., Switzerland

16:10

​High-Energy Microtomography using Synchrotron Radiation at PETRA III / DESY

Felix Beckmann, Julian Moosmann, Joerg U. Hammel, Fabian Wilde

Helmholtz-Zentrum Hereon, Germany

16:30

​Gulliver – A new kind of industrial CT

Michael Salamon¹, N. Reims¹, D. Prjamkov¹, D. Ak², M. Kronenberger³, K. Schladitz³, C. Redenbach⁴, S. Grzesiak⁴, C. De Sousa⁴, C.Thiele⁴, M.Pahn⁴​

​¹Fraunhofer-Institut für Integrierte Schaltungen (IIS), Germany; ²OHB Digital Connect GmbH, Germany; ³Fraunhofer-Institut für Techno- und Wirtschaftsmathematik (ITWM), Germany; ⁴Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau (RPTU), Germany

16:50

​Correcting for focal spot drift in edge illumination X-ray phase contrast imaging

Nicholas Francken, Jonathan Sanctorum, Ben Huyge, Jan Sijbers, Jan De Beenhouwer

University of Antwerp, Belgium

17:10