SES-04: Instrumentation and New Methods I

  • Exploring image quality improvements in high-speed dual threshold photon-counting micro-CT

Till Dreier1, Spyridon Gkoumas2

1Excillum AB, Sweden; 2DECTRIS Ltd., Switzerland


  • High-Energy Microtomography using Synchrotron Radiation at PETRA III / DESY

Felix Beckmann, Julian Moosmann, Joerg U. Hammel, Fabian Wilde

Helmholtz-Zentrum Hereon, Germany


  • Gulliver – A new kind of industrial CT

Michael Salamon1, Nils Reims1, Dimitri Prjamkov1, Dennis Ak2, Markus Kronenberger3, Katja Schladitz3, CLaudi Redenbach4, Szymon Grzesiak4, Christoph De Sousa4, Catherina Thiele4, Matthias Pahn4

1Fraunhofer-Institut für Integrierte Schaltungen (IIS), Germany; 2OHB Digital Connect GmbH, Germany; 3Fraunhofer-Institut für Techno- und Wirtschaftsmathematik (ITWM), Germany; 4Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau (RPTU), Germany


  • Correcting for focal spot drift in edge illumination X-ray phase contrast imaging

Nicholas Francken, Jonathan Sanctorum, Ben Huyge, Jan Sijbers, Jan De Beenhouwer

University of Antwerp, Belgium