SES-04: Instrumentation and New Methods I

• Exploring image quality improvements in high-speed dual threshold photon-counting micro-CT

Till Dreier¹, Spyridon Gkoumas²

¹Excillum AB, Sweden; ²DECTRIS Ltd., Switzerland

• High-Energy Microtomography using Synchrotron Radiation at PETRA III / DESY

Felix Beckmann, Julian Moosmann, Joerg U. Hammel, Fabian Wilde

Helmholtz-Zentrum Hereon, Germany

• Gulliver – A new kind of industrial CT

Michael Salamon¹, Nils Reims¹, Dimitri Prjamkov¹, Dennis Ak², Markus Kronenberger³, Katja Schladitz³, CLaudi Redenbach⁴, Szymon Grzesiak⁴, Christoph De Sousa⁴, Catherina Thiele⁴, Matthias Pahn⁴

¹Fraunhofer-Institut für Integrierte Schaltungen (IIS), Germany; ²OHB Digital Connect GmbH, Germany; ³Fraunhofer-Institut für Techno- und Wirtschaftsmathematik (ITWM), Germany; ⁴Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau (RPTU), Germany

• Correcting for focal spot drift in edge illumination X-ray phase contrast imaging

Nicholas Francken, Jonathan Sanctorum, Ben Huyge, Jan Sijbers, Jan De Beenhouwer

University of Antwerp, Belgium