• Sparse-view Material Decomposition for Spectral X-ray CT using Neural Radiance Fields

Takumi Hotta^1,4, Tatsuya Yatagawa², Yutaka Ohtake¹, Toru Aoki^3,5

¹The University of Tokyo; ²Hitotsubashi University; ³Shizuoka University; ⁴Zodiac Co., Ltd.; ⁵ANSeeN Inc.

• Volumetric sub-μ-CT imaging for forensic wood identification

Jannik Stebani^1,2, Tim Lewandrowski³, Kilian Dremel¹, Simon Zabler^1,4, Volker Haag³

¹Fraunhofer Development Center X-ray Technology EZRT; ²Lehrstuhl für Röntgenmikroskopie, Julius-Maximilians-Universität; ³Thünen Institute of Wood Research; ⁴Deggendorf Institute of Technology

• Determination of the image quality in computed tomography and its standardisation

Anne-Françoise Obaton¹, Uwe Ewert², Holger Roth³, Janka Wilbig¹, Clément Remacha⁴, Nicolas Cochennec⁴, Lionel Gay⁴, Marko Katic⁵

¹Laboratoire National de Métrologie et d'Essais (LNE), France; ²Kowotest GmbH, Germany; ³Waygate Technologies, Baker Hughes, Germany; ⁴Safran Tech, France; ⁵University of Zagreb, Croatia

• Single X-ray Projection Material Decomposition using a Mesh Projector

Fleur Linsen¹, Domenico Iuso^1,2, Jan Sijbers^1,2

¹imec-Vision Lab, Department of Physics, University of Antwerp, Antwerp, Belgium; ²DynXlab: Center for 4D Quantitative X-ray Imaging and Analysis, Antwerp, Belgium

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