For our material research, we have the following equipment available:
Contact Angle Goniometer
- Drop contact angle
Stylus Profiler (DektaXT)
- Surface profiling, step height layer thickness, surface roughness
Drying stoves and Furnaces
FTIR Spectrometer/Attunuated Total Reflection
- Material and film analaysis on transparent and opaque materials
In-situ FTIR reaction cell
- Material analysis
Irradiance spectrometer
- Wavelength and irradiance distribution
Potentiostat
- Electrochemical measurements
Spincoater
- Substrates of 1.5-15 cm diameter
- 100 - 13000 rpm
Surface area and porosity analyser + Flowprep
- Specific surface area
- Pore size distribution
Surface Photovoltage Spectroscopy
- Surface photovoltage measurements on semiconductor powders
UV-VIS spectrometer
- UV-DRS spectra powder samples
- UV-VIS spectrophotometry of various solutions (dyes, organics, etc.)
XE-lamp + monochromator
- High power light source