Holding large variety of analytical and preparative techniques at hand, we offer an entire research package, from qualified specimen preparation, high-quality observations to competent interpretation of the results and report. Investigation will be performed timely and accurately by well-trained specialists with top-level instruments. Being a versatile analytical tool, electron microscopy can be applied to a wide range of problems, relevant for materials science:
- observation of microstructure, quantification of size and shape of (nano)particles, detecting coating layers
- characterization of defects in crystalline materials
- imaging thin films and multilayer structures with atomic resolution analysis of local chemical composition, elemental mapping down to atomic scale
- strain mapping
- analysis of chemical bonding and oxidation state using electron energy loss spectroscopy
- three-dimensional (3D) imaging of particles, precipitates or inclusions
EMAT offers TEM sample preparation including mechanical, chemical and electrochemical polishing, ion beam milling and site-specific sample preparation using focused ion beam (FIB). Air-sensitive samples can be treated under Ar atmosphere (<0.1 ppm O2 and H2O) including transportation to the microscope column completely excluding contact with air.
TEM investigation can be also complemented with SEM analysis and X-ray powder diffraction, which will provide knowledge on:
- morphology and surface using conventional or FEG-SEM
- SEM observations at environmental conditions
- quantitative phase composition of your samples using energy-dispersive (EDX) or wave-dispersive (WDX) analysis;
- precise lattice parameters;
- particle size and strain;
- crystal structure from the Rietveld method.
EMAT offers training of your researchers in practical/theoretical applications of SEM and TEM aimed at:
obtaining practical skills in basic and/or advanced SEM and/or TEM techniques;
obtaining skills in interpretation and treatment of TEM results.