Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization
Source
Ultramicroscopy - ISSN 0304-3991-269 (2025) p. 1-11
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions
Source
Ultramicroscopy - ISSN 0304-3991-269 (2025) p. 1-16
Towards atom counting from first moment STEM images : methodology and possibilities
Source
Ultramicroscopy - ISSN 0304-3991-268 (2025) p. 1-11
Room temperature electron beam sensitive viscoplastic response of ultra-ductile amorphous olivine films
Source
Acta materialia - ISSN 1359-6454-282 (2025) p. 1-10
Electron energy loss dataset on TbScO3
Source
Zenodo, 2024,