Advanced characterization of (nano)materials
Holding large variety of analytical and preparative techniques at hand, we offer an entire research package, from qualified specimen preparation, high-quality observations to competent interpretation of the results. The investigation will be performed timely and accurately by well-trained specialists with top-level instruments.
- Observation of microstructure, size and shape of (nano)particles, analysis of coating layers
- Characterization of defects in crystalline materials
- Imaging thin films and multilayer structures with atomic resolution
- Analysis of local chemical composition, elemental mapping
- Three-dimensional (3D) imaging of particles, precipitates or inclusions
- Crystal structure of materials trough electron crystallography
- Orientation and strain mapping
- Analysis of band structure and optical properties using electron energy loss spectroscopy
- Quantitative nanomechanical in situ TEM experiments
- Site-specific TEM sample preparation using focused ion beam (FIB)
TEM investigation can be also complemented with the SEM analysis and X-ray powder diffraction, which will provide knowledge on:
- Morphology and surface characteristics
- SEM observations in environmental conditions
- Quantitative phase composition of your samples using energy-dispersive (EDX) or wave-dispersive (WDX) analysis
- Precise lattice parameters
- Particle size and strain
- Crystal structure from the Rietveld method
- 3D imaging through slice and view
NANOcenter also offers training for your researchers in practical/theoretical applications of SEM and TEM aimed at:
- Obtaining practical skills in basic and/or advanced SEM and/or TEM techniques
- Obtaining skills in the interpretation and treatment of TEM results