Multiscale modeling of plasma–surface interaction—General picture and a case study of Si and SiO2 etching by fluorocarbon-based plasmas. P. Vanraes, S. P. Venugopalan and A. Bogaerts Appl. Phys. Rev., 8, 041305 (2021) (article selected by the editors as Featured Article, as one of the journal's best articles) Copyright (2021) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. Following article appeared in Applied Physics Letters and may be found at: https://aip.scitation.org/doi/10.1063/5.0058904 | |
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