Abstract
X-ray computed tomography (XCT) is widely used in material sciences and industrial applications (e.g., non-destructive testing and inspection) for non-invasive imaging. While traditional XCT relies on absorption of X-rays to generate image contrast, phase contrast X-ray imaging allows to additionally measure the local scattering power in the sample as well as the phase shifts of the X-rays. Edge Illumination (EI) is a phase contrast imaging technique suitable for use with conventional, polychromatic X-ray sources, which has demonstrated its great potential for translation into real-world environments. Unfortunately, adoption of EI-XCT in industry is slow since it requires (up to 4 times) more X-ray data to be acquired, leading to substantially higher acquisition times compared to traditional XCT. In this project, I will develop acquisition and reconstruction methods for EI-XCT with scan times comparable to those of traditional XCT, while still providing the three complementary contrasts. Furthermore, the acquisition method is paired with a dedicated iterative reconstruction algorithm for increased quantification. Achieving a fast and quantitative EI-XCT will increase the potential for EI-XCT to be industrially deployed.
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