Fast STEM image simulation in low-energy transmission electron microscopy by the accurate Chen-van-Dyck multislice method

Source
Micron - ISSN 0968-4328-190 (2025) p. 1-9
Author(s)
    G.S. Chen, Y.T. He, W.Q. Ming, C.L. Wu, Dirk Van Dyck, J.H. Chen

Probing the boundary between classical and quantum mechanics by analyzing the energy dependence of single-electron scattering events at the nanoscale

Source
Nanomaterials - ISSN 2079-4991-13:6 (2023) p. 1-12
Author(s)
    Christian Kisielowski, Petra Specht, Stig Helveg, Fu-Rong Chen, Bert Freitag, Joerg Jinschek, Dirk Van Dyck

Exploring functional materials by understanding beam-sample interactions

Source
Advanced functional materials - ISSN 1616-301X-32:27 (2022) p. 1-10
Author(s)
    Christian Kisielowski, Petra Specht, Steve Rozeveld, Bert Freitag, Erik R. Kieft, Joo Kang, Alyssa J. Fielitz, Thomas R. Fielitz, Dirk Van Dyck, David F. Yancey

Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution

Source
Ultramicroscopy - ISSN 0304-3991- (2022) p.
Author(s)