Contamination in dielectric barrier discharge plasmas by electrode erosion
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ACS materials letters - ISSN 2639-4979-7:1 (2025) p. 52-58
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET) : addressing sample thickness effects
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Ultramicroscopy - ISSN 0304-3991-270 (2025) p. 1-11
High-resolution electron microscopy imaging of MOFs at optimized electron dose
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Journal of materials chemistry A : materials for energy and sustainability - ISSN 2050-7488-13:6 (2025) p. 4281-4291
Retrieval of phase information from low-dose electron microscopy experiments : are we at the limit yet?
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Microscopy and microanalysis - ISSN 1431-9276- (2025) p.
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization
Source
Ultramicroscopy - ISSN 0304-3991-269 (2025) p. 1-11