Edge-Detected 4DSTEM-effective low-dose diffraction data acquisition method for nanopowder samples in an SEM instrument

Source
European physical journal: applied physics - ISSN 1286-0042-100 (2025) p. 1-10
Author(s)

Characterization of a Timepix detector for use in SEM acceleration voltage range

Source
Ultramicroscopy - ISSN 0304-3991-253 (2023) p. 1-6
Author(s)