Edge-Detected 4DSTEM-effective low-dose diffraction data acquisition method for nanopowder samples in an SEM instrument
Source
European physical journal: applied physics - ISSN 1286-0042-100 (2025) p. 1-10
Characterization of a Timepix detector for use in SEM acceleration voltage range
Source
Ultramicroscopy - ISSN 0304-3991-253 (2023) p. 1-6
Low-cost electron detector for scanning electron microscope
Source
HardwareX - ISSN 2468-0672-14 (2023) p. 1-8