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Ultramicroscopy - ISSN 0304-3991-171 (2016) p. 104-116
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Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy

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Optimal experimental design for nano-particle atom-counting from high-resolution STEM images

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Ultramicroscopy - ISSN 0304-3991-151 (2015) p. 46-55
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