Edge-Detected 4DSTEM-effective low-dose diffraction data acquisition method for nanopowder samples in an SEM instrument

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European physical journal: applied physics - ISSN 1286-0042-100 (2025) p. 1-10
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Characterization of a Timepix detector for use in SEM acceleration voltage range

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Ultramicroscopy - ISSN 0304-3991-253 (2023) p. 1-6
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